JEOL 2000EX TEM

SPECIFICITY : Conventional microscopy

  • Electron Source: thermoelectronic gun (W or LaB6) 
  • Tilt Angle(+/-35°) 
  • Point Resolution: 0.25 nm
  • SHP20 polar piece
MET JEOL 2000 EX

PARTICULARITIES

  • Weak beam
  • In-situ experiments: heating, cooling, straining
  • numerical video recorder 
  • Wide variety of specimen holders:
    • Simple tilt
    • Double tilt
    • Tilt-Rotation
    • Simple tilt
    • Double tilt heating
    • Double tilt cooling
    • Strain

Other pages in:Microscopy (MIC)

Data access

Electron probe micro-analysis (EPMA)

Sample preparation for TEM

Microscopie électronique en transmission (MET) haute résolution

SEM Photo album

Poster – MIC technical facility

Scanning electron microscopy (SEM)

Training offer

Analytical Transmission Electron Microscopy